JOTP-053
11 March 2015
(7) Repeat steps 1 through 6 for the remaining UUTs.
b. Test Rationale. The objective of the loss of ground test is to determine if any safety
system failures, faults, or anomalies occur as a result of the ground connections being removed
from the individual voltage regulators prior to arming. This test is only intended for systems with
cascaded regulators that have separate ground references.
5.3
Safety Critical Complex Logic Device Tests.
5.3.1 Test Procedure - Floating I/O (Logic Device).
a.
Perform the steps below:
(1) Monitor the test points detailed in the test plan.
(2) Remove one of the complex logic device's electrical I/O connections allowing it to
float prior to applying power.
(3) Power up and allow the UUT to perform its functional mission.
(4) Repeat steps 2 through 3 for each remaining I/O with the exception of power.
(5) Allow the UUT to begin its functional mission.
(6) Remove one of the complex logic device's electrical I/O connections allowing it to
float. This floating condition shall occur before the enabling of any safety features (as shown on
the UUT event timeline within the test plan).
(7) Repeat steps 5 through 6 for each remaining I/O with the exception of power
(removing the ground I/O should be tested).
(8) Allow the UUT to begin its functional mission.
(9) Remove one of the complex logic device's electrical I/O connections allowing it to
float. This floating condition shall occur after the enabling of the first safety feature (as shown on
the UUT event timeline within the test plan).
(10) Repeat steps 8 through 9 for each remaining I/O with the exception of power.
(11) Repeat steps 1 through 10 for each remaining complex logic device.
(12) Repeat steps 1 through 11 for the remaining UUTs.
b. Test Rationale. The objective of this test is to verify that the complex logic device will
not respond in an unsafe manner if the I/O pins are floating, including grounds. A floating pin
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