JOTP-053
11 March 2015
TABLE 1. ELECTRICAL STRESS TEST MATRIX
FUZE OR TOP
SAFETY CRITICAL
TEST
REGULATOR
ASSEMBLY
COMPLEX LOGIC DEVICE
Under-Voltage/Over-Voltage
5.1.1
5.2.1
Power Cycling
5.1.2
Voltage Rise/Fall Time
5.1.3
Power Dropout
5.1.4
5.2.2
Brownout/Surge
5.1.5
Floating I/O
5.1.6
5.3.1
Transient Loss of Ground
5.1.7
5.2.3
5.3.2
Shorting of I/O
5.1.8
5.3.3
3.2 Selection of Test Points.
Selection of test points shall be based on engineering judgment and system architecture. As a
minimum, safety critical points shall be monitored. For example for ESADs, safety switches, the
drive circuitry to the safety switches, and the voltage on the high voltage capacitor shall be
monitored. In addition, where appropriate, the monitoring of all inputs and outputs of complex
logic devices should be monitored, as well as the output of any voltage regulators. Where practical,
the drive current through the high voltage convertor should be monitored.
3.3
Configuration of Test Item.
The test item shall be production representative hardware. Any energetic components or materials
may be replaced with simulants that maintain the electrical configuration of the item. Any
modifications or deviations shall be clearly documented and require prior SSA approval.
3.4
Number of Test Items.
A minimum of 3 units shall be tested. The test plan specifies how many items are to be tested.
3.5 Test Documentation.
Test plans, performance records, equipment, conditions, results, and analyses shall be documented
in accordance with Section 4.8 of the General Requirements of MIL-STD-331. The following
unique requirements also apply.
3.5.1 Test Plan.
The test plan shall include:
a. Identification of the Unit Under Test (UUT) as a part of an end item (e.g., system,
munition, fuze, subsystem, assembly, circuit, individual component, etc.), including:
3
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business